An electronics company that provides
test systems to the components industry.

PRA Inc.

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PRA Inc.

4821 226th Place NE
Arlington, Washington
USA 98223
Tel: 408-743-5300
E-mail:

Data Sheets

1. PRA Incorporated
2. Summary of Products
3. Ad Ver2.pdf {80KB}

1. 1020B Oscillator Bench Top Test System
2. Simple menu driven system, allows saving of specification files, ideal for incoming inspection
   Permits waveform measurements to >1GHz using a fast digital scope
   Device Output: CMOS, LVDS, PECL, Clippled Sine, Sine Wave
   Waveform Parameters: Vhigh, Vlow, Tr, Tf, Duty Cycle, Pulse Width
3. 1020DS.PDF {566KB}

1. 2400G Oscillator Temperature Testing System
2. Measures Clock Oscillators, TCXOs, VCXOs, TCVCXOs, OCXOs
   Devices mounted in a Test Wheel
   Permits waveform measurements to >1GHz
   Device Output: CMOS, LVDS, PECL, Clippled Sine, Sine Wave
3. 2400G System.pdf {223KB}

1. 2212 Oscillator Temperature Testing System
2. Fastest meaurement system
   Ideal for perturbation testing of crystals and oscillators
   Measures Clock Oscillators, TCXOs, VCXOs, TCVCXOs, OCXOs
   Devices mounted in electonically multiplexed Test Cards
   Ideal for SMD Ceramic LCC Oscillator packages
   Special measurements for compensating TCXOs and OCXOs
   Device Output: CMOS, LVDS, PECL, Clippled Sine, Sine Wave
3. 2212DS.pdf {337KB}

1. 2553 Crystal Temperature Test System
2. Uses a Agilent/HP E5100 Network Analyzer
   Passive Network Test System compatible with IEC444 methods
   Permits testing crystals from 10KHz to 300MHz with Qs of >1M
3. 2553DS.PDF {208KB}

1. 2350B OCXO Aging System
2. Permits aging over 200 OCXOs (expandable in steps of 60 each OCXOs
   OCXOs mounted on Test Cards configured for specific OCXO packages
   Resolution to better than 0.01ppb, accuracy determined by external reference standard
3. 2350BDS.PDF {1030KB}

1. 2360 Crystal and Oscillator Aging System
2. Largest version can age 4064 devices in a chamber at user set temperatures
   The chamber can be set to age in the range of 75°C t0 125°C
3. 2360DS.PDF {271KB}

1. 6200A Temperature Chamber
2. The temperature chamber used in the PRA Model 2400 and 2553 Test System
3. 6200DS.PDF {229KB}

1. 66322 Temperature Chamber
2. The temperature chamber used in the PRA Model 2212 Test System
3. 66322DS.PDF {295KB}

1. 66343 Temperature Chamber
2. The temperature chamber used in the PRA Model 2360B Test System
3. 66343DS.PDF {187KB}

1. 520 Frequency Standard Distribution System
2. Provides isolated and buffered 10MHz frequency distribution system
3. 520DS.PDF {154KB}

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