Simple menu driven system, allows saving of specification files, ideal for incoming inspection Permits waveform measurements to >1GHz using a fast digital scope Device Output: CMOS, LVDS, PECL, Clippled Sine, Sine Wave Waveform Parameters: Vhigh, Vlow, Tr, Tf, Duty Cycle, Pulse Width
Fastest meaurement system Ideal for perturbation testing of crystals and oscillators Measures Clock Oscillators, TCXOs, VCXOs, TCVCXOs, OCXOs Devices mounted in electonically multiplexed Test Cards Ideal for SMD Ceramic LCC Oscillator packages Special measurements for compensating TCXOs and OCXOs Device Output: CMOS, LVDS, PECL, Clippled Sine, Sine Wave
Uses a Agilent/HP E5100 Network Analyzer Passive Network Test System compatible with IEC444 methods Permits testing crystals from 10KHz to 300MHz with Qs of >1M
Permits aging over 200 OCXOs (expandable in steps of 60 each OCXOs OCXOs mounted on Test Cards configured for specific OCXO packages Resolution to better than 0.01ppb, accuracy determined by external reference standard